Nanjing Normal University
4 days ago
Postdoctoral Researcher in FIB-SEM, Advanced SEM, and In Situ Experiments at Anhui Normal University Anhui Normal University in China
Degree Level
Postdoc
Field of study
Electrical Engineering
Funding
Available
Country
China
University
Nanjing Normal University

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About this position
Postdoctoral opening at Anhui Normal University (AHNU), Wuhu, China in the SEED Lab – Sensing and Energy Engineering for Device Technologies with Prof. Mark H. Rümmeli.
The project focuses on FIB-SEM, advanced SEM, in situ microscopy experiments, and the use of electron microscopy as a platform for nanomaterials, sensor devices, electron- and ion-beam processing, and materials modification. The lab is looking for a practical, hands-on experimentalist who can help establish an advanced electron microscopy platform and independently run experiments, workflows, and instrument optimization.
Ideal background: a PhD in a relevant discipline; substantial independent experience with FIB-SEM or strong SEM expertise beyond routine imaging; ability to troubleshoot and develop workflows; independent research capability; and experience training students. Particularly valuable are skills in in situ electrical measurements, biasing, heating, mechanical testing, gas environments, nanomanipulation, custom setups, beam deposition/patterning, FIB milling, cross-sectioning, 3D serial-section analysis, automation, scripting, or API-based control.
How to apply: email Prof. Rümmeli at [email protected] with your CV, publication list, expected availability, and a technical summary (max two pages). Include the instrument models you have personally operated, your level of independent operation, and the experiments or setups you developed. Representative microscopy images or setup photos are encouraged.
Note: this call is for postdoctoral applications only. No deadline was stated in the post.
Funding details
Available
What's required
A PhD in a relevant discipline is required. Candidates should have substantial independent experience operating FIB-SEM, or strong hands-on SEM expertise beyond routine image acquisition. They must be able to develop and troubleshoot experimental workflows, optimize instrument conditions, plan and conduct research independently, and train students in advanced microscopy methods. Experience with in situ electrical measurements, biasing, heating, mechanical testing, gases, nanomanipulation, custom setups, electron- or ion-beam deposition/patterning, FIB milling, cross-sectioning, 3D serial-section analysis, automation, scripting, or API-based control is particularly valuable. Applicants limited to sample preparation or post-acquisition data analysis are not suitable.
How to apply
Email Prof. Rümmeli with your CV, publication list, expected availability, and a technical summary of up to two pages. Include details of instruments operated, level of independence, experiments or setups developed, and representative images or schematics if relevant. Use the subject line: Postdoc, FIB SEM and Advanced SEM.
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