Ahmed M. Hassan

Assistant Professor

University of Missouri Kansas City

United States

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Ahmed M. Hassan is an Assistant Professor at the University of Missouri Kansas City, USA. His research areas encompass electromagnetic compatibility, plasmonic sensors, and carbon nanotubes, as highlighted in his recent publications. He has contributed to a variety of topics including electromagnetic coupling measurements, optical scattering characteristics, and the optimization of plasmonic nanoantennas.

Articles (11)

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2024

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2023

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2022

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2022

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2022

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2022

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2022

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2021

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2020

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2020

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2020

Collaborators (6)

Anthony N. Caruso

University of Missouri Kansas City

UNITED STATES

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Aaron Harmon

Missouri University of Science and Technology

UNITED STATES

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Daryl Beetner

Professor

Missouri University of Science and Technology

UNITED STATES

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Buon Kiong Lau

Professor

Lund University

SWEDEN

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Shengxuan Xia

Missouri University of Science and Technology

UNITED STATES

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Victor Khilkevich

Missouri University of Science and Technology

UNITED STATES

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Ahmed M. Hassan

Research Interests

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Contact this professor

About

Articles (11)

A Segmentation Approach for Predicting Plane Wave Coupling to PCB Structures

SARS-CoV-2 Detection Using Colorimetric Plasmonic Sensors: A Proof-of-Concept Computational Study

Characteristic Mode Analysis Prediction and Guidance of Electromagnetic Coupling Measurements to a UAV Model

Method of Moment Analysis of Carbon Nanotubes Embedded in a Lossy Dielectric Slab Using a Multilayer Dyadic Green’s Function

Characteristic Modes: Progress, Overview, and Emerging Topics.

Electromagnetic Compatibility Analysis of Quadcopter UAVs Using the Equivalent Circuit Approach

Optical Scattering Characteristics of 3-D Lunar Regolith Particles Measured Using X-Ray Nano Computed Tomography

Asymmetric carbon nanotube dimers embedded in a dielectric slab: new plasmonic resonance behavior

Electromagnetic resonance analysis of asymmetric carbon nanotube dimers for sensing applications

Plasmonic Nanoantenna Optimization Using Characteristic Mode Analysis

Machine Learning Classification of S-Band Microwave Scattering Measurements From the Forearm as a Novel Biometric Technique

Collaborators (6)

Anthony N. Caruso

Aaron Harmon

Daryl Beetner

Buon Kiong Lau

Shengxuan Xia

Victor Khilkevich

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