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Andreas Hertwig

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Senior Scientist

Federal Institute For Materials Research and Testing

Germany

Research Interests

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Professors in Germany

Recent Grants

Grant: Close

Electrical nanoscale metrology in industry

Open Date: 2021-09-01

Close Date: 2024-08-01

Grant: Close

Traceable metrology of soft X-ray to IR optical constants and nanofilms for advanced manufacturing

Open Date: 2021-07-01

Close Date: 2024-06-01

Grant: Close

Metrology in manufacturing compound semiconductors for power electronics

Open Date: 2021-06-01

Close Date: 2024-05-01

Grant: Close

Hybrid metrology for thin films in energy applications

Open Date: 2017-06-01

Close Date: 2020-05-01

Grant: Close

Traceable characterisation of thin-film materials for energy applications

Open Date: 2014-07-01

Close Date: 2017-06-01

Articles (11)

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2026

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2025

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2025

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2024

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2024

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2024

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2024

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2024

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2023

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2023

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2023

Collaborators (4)

Joerg Radnik

Researcher (academic)

Federal Institute For Materials Research and Testing

GERMANY

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Jörg Krüger

Federal Institute For Materials Research and Testing

GERMANY

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Nadja C. Bigall

Chair (Full Professor) for Physical Chemistry and Dynamics of Nanoscopic Systems

Universität Hamburg

GERMANY

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Andreas-Neil Unterreiner

Privatdozent

Karlsruhe Institute of Technology

GERMANY

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Andreas Hertwig

Research Interests

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Recent Grants

Articles (11)

Comparison of thin-film thickness measurements using ellipsometry and reflectometry with uniform samples

Multimethod Electrical Characterization of Thin Indium Tin Oxide Films: Structuring and Calibration Sample Development for Scanning Probe Microscopy

Molecular mobility of thin films and the adsorbed layer of poly(2-vinylpyridine)

A multi-method study of femtosecond laser modification and ablation of amorphous hydrogenated carbon coatings

Chemical and Topographical Changes upon Sub-100-nm Laser-Induced Periodic Surface Structure Formation on Titanium Alloy: The Influence of Laser Pulse Repetition Rate and Number of Over-Scans

Picosecond Laser Processing of Hierarchical Micro-Nanostructures on Titanium Alloy upon Pre- and Postanodization: Morphological, Structural, and Chemical Effects

Investigations of the adsorbed layer of polysulfone: Influence of the thickness of the adsorbed layer on the glass transition of thin films

Monitoring the Electrochemical Failure of Indium Tin Oxide Electrodes via Operando Ellipsometry Complemented by Electron Microscopy and Spectroscopy

Influence of nanoparticle encapsulation and encoding on the surface chemistry of polymer carrier beads

Growth kinetics of the adsorbed layer of poly(bisphenol A carbonate) and its effect on the glass transition behavior in thin films

Application of imaging ellipsometry and white light interference microscopy for detection of defects in epitaxially grown 4H–SiC layers

Collaborators (4)

Joerg Radnik

Jörg Krüger

Nadja C. Bigall

Andreas-Neil Unterreiner

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