Bert Stegemann

Absolute calibrated hyperspectral photoluminescence (PL) imaging is utilized to access, in a simple and fast way, the spatial distribution of relevant solar cell parameters such as quasi‐Fermi level splitting, optical diode factor, Urbach energies E u , and shunt resistances R sh , without the need for electrical measurements. Since these metrics play a significant role in evaluating the process windows for electrical series interconnection by laser patterning, this approach is followed to systematically locate and quantify electrical losses that may occur as a result of the laser‐patterning process for monolithic series interconnection. It is shown that both picosecond and nanosecond laser pulses can be used for successful series interconnection. In both cases, only minor lateral material alterations occur, localized in a few μm wide region adjacent to the edges of the scribe lines. Furthermore, the acquisition and analysis of these hyperspectral PL datasets provide insights in the material removal process, from which it is concluded that the perovskite is rather resilient against the thermal impact of the laser.