E. Castilla

Universidad Rey Juan Carlos

Spain

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Articles (17)

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2025

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2022

Collaborators (6)

María Jaenada

Universidad Complutense de Madrid

SPAIN

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Nirian Martín

Associate Professor in the Mathematics Faculty

Universidad Complutense de Madrid

SPAIN

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Leandro Pardo

Universidad Complutense de Madrid

SPAIN

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Pedro José Chocano Feito

Assistant Professor

Universidad Rey Juan Carlos - Campus de Fuenlabrada

SPAIN

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Narayanaswamy Balakrishnan

McMaster University

CANADA

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Konstantinos Zografos

University of Ioannina

GREECE

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E. Castilla

Research Interests

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Articles (17)

On Jensen-$$\phi $$-divergence measure: Applications to logistic regression model and image processing

Robust inference and model selection for data from one-shot devices under cyclic accelerated life-tests with an application to a test of CSP solder joints

Parametric estimation and robust inference for current status data with Lindley lifetimes

Robust inference for destructive one-shot device test data under Weibull lifetimes and competing risks

A new robust approach for the polytomous logistic regression model based on Rényi’s pseudodistances

A new estimation approach based on phi‐divergence measures for one‐shot device accelerated life testing

El Modelo de Regresión Lineal y el Problema de Mínimos Cuadrados

Power divergence approach for one-shot device testing under competing risks

Robust estimation based on one-shot device test data under log-normal lifetimes

Robust inference for nondestructive one‐shot device testing under step‐stress model with exponential lifetimes

Robust Minimum Divergence Estimation for the Multinomial Circular Logistic Regression Model

A New Robust Approach for Multinomial Logistic Regression With Complex Design Model

Robust approach for comparing two dependent normal populations through Wald-type tests based on Rényi’s pseudodistance estimators

Estimation and Testing on Independent Not Identically Distributed Observations Based on Rényi’s Pseudodistances

EM‐based likelihood inference for one‐shot device test data under log‐normal lifetimes and the optimal design of a CSALT plan

On distance-type Gaussian estimation

Optimal designs of constant‐stress accelerated life‐tests for one‐shot devices with model misspecification analysis

Collaborators (6)

María Jaenada

Nirian Martín

Leandro Pardo

Pedro José Chocano Feito

Narayanaswamy Balakrishnan

Konstantinos Zografos

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