Ehrenfried Zschech

Professor

Brandenburgische Technische Universität Cottbus-Senftenberg

Germany

Research Interests

Explore related searches

Professors in Germany Professors in Materials Science Materials Science professors in Germany

Contact this professor

Get a free first email built on one of their papers, ready for you to edit and send yourself.

About

Professor Ehrenfried Zschech is a faculty member at Brandenburg University of Technology Cottbus-Senftenberg in Germany. His research areas include advanced X-ray microscopy techniques, nanostructure analysis, and the study of microcrack evolution in materials. His recent work emphasizes the application of high-contrast X-ray microscopy and tomography in various nanotechnology and materials science contexts.

Articles (9)

Year:

2024

Year:

2024

Year:

2023

Year:

2022

Year:

2022

Year:

2021

Year:

2021

Year:

2021

Year:

2021

Collaborators (3)

JAN DEJA

AGH University of Krakow

POLAND

View details

André Clausner

Head of department

Fraunhofer IKTS, Fraunhofer Institute for Ceramic Technologies and Systems

GERMANY

View details

Robert Filipek

AGH University of Krakow

POLAND

View details

ApplyKite TwinLearns as you apply

Make your next move.

Prepare your application

Review drafts before you send them.

Ehrenfried Zschech

Research Interests

Explore related searches

Contact this professor

About

Articles (9)

Laboratory High-Contrast X-ray Microscopy of Copper Nanostructures Enabled by a Liquid-Metal-Jet X-ray Source

Laboratory X-ray Microscopy of 3D Nanostructures in the Hard X-ray Regime Enabled by a Combination of Multilayer X-ray Optics

3D Multi-Ion Corrosion Model in Hierarchically Structured Cementitious Materials Obtained from Nano-XCT Data

Cylindrical Indentation to Selectively Stress Nanoscale CMOS Transistors

In-situ X-ray tomographic imaging and controlled steering of microcracks in 3D nanopatterned structures

Laboratory X-ray Microscopy Study of Microcrack Evolution in a Novel Sodium Iron Titanate-Based Cathode Material for Li-Ion Batteries

Piezoresistive Characteristics of MOSFET Channels Determined With Indentation

Determination of the Filler Distribution in an Epoxy Molding Compound Using High-Resolution X-Ray Computed Tomography

Stress-Induced Transistor Degradation Studied by an Indentation Approach

Collaborators (3)

JAN DEJA

André Clausner

Robert Filipek

Make your next move.