Feng Gao

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University of Huddersfield

United Kingdom

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Recent Grants

Grant: Close

Next Generation Metrology Driven by Nanophotonics

Open Date: 2020-08-31

Close Date: 2025-08-30

Grant: Close

A Multiscale Digital Twin-Driven Smart Manufacturing System for High Value-Added Products

Open Date: 2020-04-30

Close Date: 2024-04-29

Grant: Close

Future Advanced Metrology Hub

Open Date: 2017-03-01

Close Date: 2024-02-29

Grant: Close

EPSRC High Value Manufacturing Catapult fellowship

Open Date: 2014-01-01

Close Date: 2017-12-01

Grant: Close

On-line surface inspection of roll-to-roll film processing

Open Date: 2013-04-30

Close Date: 2014-10-31

Articles (13)

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2025

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2024

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2024

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2023

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2023

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2023

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2023

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2023

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2023

Year:

2023

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2022

Year:

2022

Year:

2022

Collaborators (3)

Zhaozong Meng

The University of Manchester

UNITED KINGDOM

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Yongjia Xu

University of Huddersfield

UNITED KINGDOM

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Xiangqian Jiang

University of Huddersfield

UNITED KINGDOM

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Feng Gao

Research Interests

Explore related searches

Contact this professor

Recent Grants

Articles (13)

Deep-learning-enabled single-shot high-frequency color fringe projection profilometry based on dual inner shifting-phase method

Error compensation for near optical coaxial phase measuring deflectometry with refraction error model

Incoherent partial superposition modeling for single-shot angle-resolved ellipsometry measurement of thin films on transparent substrates

Portable multiscale form measurement technique for structured specular surfaces based on phase measuring deflectometry

Iteration of B-spline surface based deflectometric method for discontinuous specular surface

Aided Imaging Phase Measuring Deflectometry Based on Concave Focusing Mirror

A flexible lateral chromatic aberration correction method for a color-encoded fringe projection system

Polarized angle-resolved spectral reflectometry for real-time ultra-thin film measurement

基于条纹投影和双屏透射显示的复合表面三维测量方法

Defocus Effect Correction for Back Focal Plane Ellipsometry for Antivibration Measurement of Thin Films

Stereo deflectometry based automatic segmentation technique for measuring structured specular surfaces

High-accuracy camera calibration method based on coded concentric ring center extraction

Three-dimensional reconstruction from a fringe projection system through a planar transparent medium

Collaborators (3)

Zhaozong Meng

Yongjia Xu

Xiangqian Jiang

Make your next move.

Feng Gao

Research Interests

Explore related searches

Contact this professor

Recent Grants

Articles (13)

Deep-learning-enabled single-shot high-frequency color fringe projection profilometry based on dual inner shifting-phase method

Error compensation for near optical coaxial phase measuring deflectometry with refraction error model

Incoherent partial superposition modeling for single-shot angle-resolved ellipsometry measurement of thin films on transparent substrates

Portable multiscale form measurement technique for structured specular surfaces based on phase measuring deflectometry

Iteration of B-spline surface based deflectometric method for discontinuous specular surface

Aided Imaging Phase Measuring Deflectometry Based on Concave Focusing Mirror

A flexible lateral chromatic aberration correction method for a color-encoded fringe projection system

Polarized angle-resolved spectral reflectometry for real-time ultra-thin film measurement

基 于 条 纹 投 影 和 双 屏 透 射 显 示 的 复 合 表 面三 维 测 量 方 法

Defocus Effect Correction for Back Focal Plane Ellipsometry for Antivibration Measurement of Thin Films

Stereo deflectometry based automatic segmentation technique for measuring structured specular surfaces

High-accuracy camera calibration method based on coded concentric ring center extraction

Three-dimensional reconstruction from a fringe projection system through a planar transparent medium

Collaborators (3)

Zhaozong Meng

Yongjia Xu

Xiangqian Jiang

Make your next move.

基于条纹投影和双屏透射显示的复合表面三维测量方法