Henryk Bednarski

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Assistant Professor

Polish Academy of Sciences

Poland

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Badanie właściwości protonowanych cienkich warstw organicznych na bazie aromatycznych poliazometin

Open Date: 2011-05-24

Close Date: 2013-05-23

Articles (17)

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Collaborators (2)

Tomasz Tański

Silesian University of Technology

POLAND

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Mateusz Fijalkowski

Technical University of Liberec

CZECH REPUBLIC

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Henryk Bednarski

Research Interests

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Recent Grants

Articles (17)

Thermal Transitions and Structural Characteristics of Poly(3,4-ethylenedioxythiophene/cucurbit[7]uril) Polypseudorotaxane and Polyrotaxane Thin Films

Temperature Coefficient of Electronic Polarizability in Thin Polymer Films Deposited on Si and SiO2 Substrates Determined via Spectroscopic Ellipsometry

Thermal and optical properties of P3HT:PC70BM:ZnO nanoparticles composite films

Variable Temperature Spectroscopic Ellipsometry as a Tool for Insight into the Optical Order in the P3HT:PC70BM and PC70BM Layers

Exploring the Influence of P3HT on PTCA Crystallization and Phase Behavior in Thin Films

Variable Temperature Spectroscopic Ellipsometry as a Tool for Insight into the Optical Order in the P3HT:PC70BM and PC70BM Layers

The Investigation of Thermal and Optical Properties of Semiconducting Nanostructural Hybrid Films

An Investigation of the Thermal Transitions and Physical Properties of Semiconducting PDPP4T:PDBPyBT Blend Films

An Investigation of the Thermal Transitions and Physical Properties of Semiconducting PDPP4T:PDBPyBT Blend Films

The Investigation of Thermal and Optical Properties of Semiconducting Nanostructural Hybrid Films

Thermal and optical properties of PMMA films reinforced with Nb<sub>2</sub>O<sub>5</sub> nanoparticles.

Dispersion of thermo-optic coefficient of optical polymers

In situ thermo-optical studies of polymer:fullerene blend films

Phase diagram of P3HT:PC70BM thin films based on variable-temperature spectroscopic ellipsometry

Phase diagram of P3HT:PC70BM thin films based on variable-temperature spectroscopic ellipsometry

Temperature-Dependent Spectroscopic Ellipsometry of Thin Polymer Films

Thermal transitions in P3HT:PC60BM films based on electrical resistance measurements

Collaborators (2)

Tomasz Tański

Mateusz Fijalkowski

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