Hirokazu Fujiwara
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Project Assistant Professor
JapanResearch Interests
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About
Hirokazu Fujiwara is a Project Assistant Professor at The University of Tokyo, Japan. His research focuses on advanced microscopy techniques in the study of ferroelectric devices and semiconductors, with significant contributions in areas such as photoemission electron microscopy, dielectric breakdown behavior, and spin-dependent electron correlations. His recent publications demonstrate a commitment to exploring high-throughput inspection methods and nondestructive imaging in electronic materials and devices.
Recent Grants
Grant: Close
電子デバイス向けレジストの瞬間潜像イメージング
Open Date: 2024-07-01
Close Date: 2025-06-01
Grant: Close
非破壊オペランドナノイメージングで可視化する酸化物デバイスの特性変動過程
Open Date: 2023-04-01
Close Date: 2025-03-01
Grant: Close
オペランドレーザー励起光電子顕微鏡を用いた薄膜強誘電体HfO2に関する研究
Open Date: 2023-01-01
Close Date: 2024-03-01
Grant: Close
レーザー・電気計測・光電子顕微鏡を融合させた電子デバイスの自動非破壊不良検査システムの構築
Open Date: 2023-01-01
Close Date: 2024-03-01
Grant: Close
超伝導体/ハーフメタル界面を用いたマヨラナフェルミオンの探索
Open Date: 2016-04-01
Close Date: 2019-03-01
Articles (8)
Year:
2025
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2025
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2024
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2024
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2023
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2022
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2021
Year:
2020
Collaborators (3)
Junya Otsuki
Associate Professor
Okayama University
Mario Okawa
Waseda University
Nayuta Takemori
Associate Professor
Osaka University
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