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Jae-Sang Hyun

Assistant Professor

Yonsei University

South Korea

Research Interests

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Professors in South Korea

About

Dr. Jae-Sang Hyun is an Assistant Professor at Yonsei University in South Korea. His research areas include advanced techniques in three-dimensional imaging and profilometry, with a focus on methods such as fringe projection, photometric stereo networks, and high-speed shape measurement. His recent publications demonstrate innovative approaches to calibration and error reduction in structured light systems and applications in automated 3D imaging.

Articles (15)

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2026

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2026

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2026

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2021

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2020

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2020

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2020

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2020

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2020

Collaborators (2)

Liang Pan

Assitant Professor

Purdue University

UNITED STATES

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Sangpil Kim

Assistant Professor

Korea University

SOUTH KOREA

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Jae-Sang Hyun

Research Interests

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Articles (15)

High-Precision 6-DoF Pose Estimation via Global Phase Retrieval in Fringe Projection Profilometry for 3-D Mapping

Retinal layer segmentation in OCT images with a 2.5D cross-slice feature fusion module for glaucoma assessment

Cylindrical Mechanical Projector for Omnidirectional Fringe Projection Profilometry

Fringe projection profilometry using model-free distorted patterns

Novel Omnidirectional Calibration for Structured Light Systems Using Fisheye–Catadioptric Optics

Quasi-calibration method for structured light system with auxiliary camera

Single-shot calibration method based on Fourier transform profilometry

Motion-Induced Error Reduction for Motorized Digital Fringe Projection System

Event fusion photometric stereo network

Portable high-resolution automated 3D imaging for footwear and tire impression capture

Autofocusing method for high-resolution three-dimensional profilometry

High-speed three-dimensional absolute shape measurement with three projected binary patterns

Influence of projector pixel shape on ultrahigh-resolution 3D shape measurement

Multilevel symmetric pattern design and optimization for high-speed and high-accuracy 3D shape measurement

Uniaxial three-dimensional phase-shifting profilometry using a dual-telecentric structured light system in micro-scale devices

Collaborators (2)

Liang Pan

Sangpil Kim

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