Jeff Terry

Professor

Illinois Institute of Technology

United States

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Jeff Terry is a Professor at the Illinois Institute of Technology in the United States. His research areas focus on advanced materials characterization, with a particular interest in X-ray photoelectron spectroscopy (XPS), actinide materials, and the application of artificial intelligence in data analysis. Recent articles authored by Professor Terry include studies on X-ray emission spectroscopy and radiation damage in materials for neutrino production. He is committed to improving reproducibility and reporting standards in scientific data collection and analysis.

Articles (19)

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2025

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2021

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2021

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2021

Collaborators (6)

Tim Prüßmann

Karlsruher Institut für Technologie

GERMANY

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samira jafari

Brigham Young University

UNITED STATES

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Min Long

Assistant Professor

Boise State University

UNITED STATES

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Jan Čechal

Brno University of Technology

CZECH REPUBLIC

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Pavitra Govindan

University of Utah

UNITED STATES

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Xiaoyu Wang

University at Albany, State University of New York

UNITED STATES

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Jeff Terry

Research Interests

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About

Articles (19)

Analysis of x-ray emission spectroscopy (XES) data using artificial intelligence techniques included in the XES Neo package

Actinide 5f Occupations: The Case of PuO2

The case for denoising/smoothing X-ray photoelectron spectroscopy data by Fourier analysis

Radiation damage study of POCO ZXF-5Q graphite for neutrino production targets using 4.5 MeV helium ions

New method for collecting XPS and other spectra: A thought (Gedanken) experiment

Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters

Review of actinide core-level photoemission

Artificial intelligence based analysis of nanoindentation load–displacement data using a genetic algorithm

Insufficient reporting of x-ray photoelectron spectroscopy instrumental and peak fitting parameters (metadata) in the scientific literature

Perspective on improving the quality of surface and material data analysis in the scientific literature with a focus on x-ray photoelectron spectroscopy (XPS)

Corrigendum to “Artificial intelligence based analysis of nanoindentation load–displacement data using a genetic algorithm” [Appl. Surf. Sci. 612 (2023) 155734]

Materials characterization: Can artificial intelligence be used to address reproducibility challenges?

Microstructure and corrosion behavior of differently heat-treated Ti-6Al-4V alloy processed by laser powder bed fusion of hydride-dehydride powder

Erratum: “Practical guide for curve fitting in x-ray photoelectron spectroscopy” [J. Vac. Sci. Technol. A 38, 061203 (2020)]

Analysis of extended X-ray absorption fine structure (EXAFS) data using artificial intelligence techniques

Exploration of the nonideal behavior observed in engineered, multilayer MgO/Ag/MgO photocathodes

Combined EXAFS and MD study to elucidate defect behaviors and stage IV recovery mechanism in heavy ion irradiated molybdenum

Biomimetically synthesized luminescent Tb3+-doped fluorapatite/agar nanocomposite for detecting UO22+, Cu2+, and Cr3+ ions

Revealing the chemical environment of Cr, Fe, and Ni in high temperature-ultrafine precipitate strengthened steel subjected to low fluence neutron irradiation

Collaborators (6)

Tim Prüßmann

samira jafari

Min Long

Jan Čechal

Pavitra Govindan

Xiaoyu Wang

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