Josef Simbrunner

ao Univ Prof

Medical University of Graz

Austria

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Josef Simbrunner is an Associate University Professor at Medizinische Universität Graz, Austria. His research focuses on grazing-incidence X-ray diffraction, crystallography, and thin film analysis. Recent publications include works on quantitative orientation analysis, sample misalignment impacts, and the engineering of phase transitions in crystalline materials.

Articles (13)

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2025

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2025

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2025

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2023

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2022

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2022

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2022

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2022

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2021

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2021

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2021

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2020

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2020

Collaborators (6)

Roman Forker

GERMANY

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Jorid Smets

University of Antwerp

BELGIUM

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Ingo Salzmann

CANADA

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Jie Liu

University of Warwick

UNITED KINGDOM

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Martin Kaltenegger

Université libre de Bruxelles (ULB)

BELGIUM

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Torsten Fritz

Full professor

Friedrich Schiller University Jena

GERMANY

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Josef Simbrunner

Research Interests

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About

Articles (13)

Finding Crystal Orientations in Uniplanar Textures

A systematic approach for quantitative orientation and phase fraction analysis of thin films through grazing-incidence X-ray diffraction

Intensity corrections for grazing-incidence X-ray diffraction of thin films using static area detectors

Indexing of grazing-incidence X-ray diffraction patterns

Impact of sample misalignment on grazing incidence x-ray diffraction patterns and the resulting unit cell determination

Correlation between two- and three-dimensional crystallographic lattices for epitaxial analysis. I. Theory

Correlation between two- and three-dimensional crystallographic lattices for epitaxial analysis. II. Experimental results

Engineering of a kinetically driven phase of phenoxazine by surface crystallisation

Automatic indexing of two-dimensional patterns in reciprocal space

Aggregate formation in crystalline blends of α-sexithiophene and para-sexiphenyl

<i>GIDInd</i>: an automated indexing software for grazing-incidence X-ray diffraction data.

Searching for New Polymorphs by Epitaxial Growth.

An efficient method for indexing grazing-incidence X-ray diffraction data of epitaxially grown thin films.

Collaborators (6)

Roman Forker

Jorid Smets

Ingo Salzmann

Jie Liu

Martin Kaltenegger

Torsten Fritz

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