Lewys Jones

Ussher Assistant Professor in Ultramicroscopy

Trinity College Dublin

Ireland

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About

Dr. Lewys Jones is the Ussher Assistant Professor in Ultramicroscopy at Trinity College Dublin, Ireland. His research focuses on ultramicroscopy techniques, specifically the characterization of electrically active defects in semiconductor systems, as well as advancements in electron counting and phase retrieval techniques. Recent publications include works on ferroelectric materials and innovations in scanning transmission electron microscopy.

Articles (18)

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2025

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2022

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2021

Collaborators (8)

Colin Ophus

Associate Professor

Stanford University

UNITED STATES

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Georgios Varnavides

Delft University of Technology

NETHERLANDS

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Ryo Ishikawa

Project Associate Professor

University of Tokyo

JAPAN

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Ali Mostaed

University of Oxford

UNITED KINGDOM

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Philipp Michael Pelz

Professor

Friedrich-Alexander Universität Erlangen-Nürnberg

GERMANY

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Amit Kumar

Lecturer

The Queen's University Belfast

UNITED KINGDOM

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Stefano Sanvito

Trinity College

IRELAND

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Chadwin Young

Associate Professor

University of Texas at Dallas

UNITED STATES

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Lewys Jones

Research Interests

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About

Articles (18)

Evaluating the Transfer of Information in Phase Retrieval STEM Techniques

The characterization and understanding of electrically active defects in the HfO2/β-Ga2O3(2̄01) MOS system

Auto-thresholding for unbiased electron counting

Publisher Correction: Ferroelectricity at the extreme thickness limit in the archetypal antiferroelectric PbZrO3

Ferroelectricity at the extreme thickness limit in the archetypal antiferroelectric PbZrO3

Ultra-fast Digital DPC Yielding High Spatio-temporal Resolution for Low-Dose Phase Characterization

Video frame interpolation neural network for 3D tomography across different length scales

Event-responsive scanning transmission electron microscopy

Electron counting detectors in scanning transmission electron microscopy via hardware signal processing

A Retrofittable Photoelectron Gun for Low-Voltage Imaging Applications in the Scanning Electron Microscope

How Fast is Your Detector? The Effect of Temporal Response on Image Quality

Interlacing in Atomic Resolution Scanning Transmission Electron Microscopy

Machine-learning approach for quantified resolvability enhancement of low-dose STEM data

Experimental reconstructions of 3D atomic structures from electron microscopy images using a Bayesian genetic algorithm

Cost and Capability Compromises in STEM Instrumentation for Low-Voltage Imaging

Increasing Spatial Fidelity and SNR of 4D-STEM Using Multi-Frame Data Fusion

Using Your Beam Efficiently: Reducing Electron Dose in the STEM via Flyback Compensation

Prismatic 2.0 – Simulation software for scanning and high resolution transmission electron microscopy (STEM and HRTEM)

Collaborators (8)

Colin Ophus

Georgios Varnavides

Ryo Ishikawa

Ali Mostaed

Philipp Michael Pelz

Amit Kumar

Stefano Sanvito

Chadwin Young

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