Matias Kagias

Assistant Professor

Lund University

Sweden

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About

Matias Kagias is an Assistant Professor at Lund University, Sweden. His research focuses on advanced imaging techniques and materials science, as demonstrated in recent articles exploring topics such as holographic lithography, X-ray grating interferometry, and dark-field imaging methods. Through his work, he aims to enhance the understanding of material properties and behaviors at the microscale and nanoscale.

Articles (13)

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2023

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2023

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2022

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2022

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2022

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2022

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2021

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2021

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2021

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2021

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2021

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2020

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2020

Collaborators (9)

Marco Francesco Mario Stampanoni

Full Professor

ETH Zürich

SWITZERLAND

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Jens Wenzel Andreasen

Technical University of Denmark

DENMARK

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Daniel Pelt

Leiden University

NETHERLANDS

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Matthieu N. Boone

Ghent University

BELGIUM

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Veerle Cnudde

Utrecht University

NETHERLANDS

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Jisoo Kim

Assistant Professor

Korea Advanced Institute of Science and Technology

SOUTH KOREA

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Chiara Carminati

SWITZERLAND

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Andrei Faraon

Professor

California Institute of Technology

UNITED STATES

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Jan Aelterman

Professor

Ghent University

BELGIUM

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Matias Kagias

Research Interests

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About

Articles (13)

Optimization of the visibility of a tunable dual-phase x-ray grating interferometer

Metasurface‐Enabled Holographic Lithography for Impact‐Absorbing Nanoarchitected Sheets

Exploration of the X-ray dark-field signal in mineral building materials

Envelope modulated x-ray grating interferometry

Macroscopic mapping of microscale fibers in freeform injection molded fiber-reinforced composites using X-ray scattering tensor tomography

Tomographic Reconstruction of the Small-Angle X-Ray Scattering Tensor with Filtered Back Projection

Fabrication of X-ray Gratings for Interferometric Imaging by Conformal Seedless Gold Electroplating

Simultaneous Reciprocal and Real Space X-Ray Imaging of Time-Evolving Systems

Fast acquisition protocol for X-ray scattering tensor tomography

On the definition, utility, and practical implementation of X-ray omnidirectional differential phase contrast and dark-field imaging

Tunable X-ray dark-field imaging for sub-resolution feature size quantification in porous media

X-ray scattering tensor tomography with circular gratings

Characterization of oriented microstructures through anisotropic small-angle scattering by 2D neutron dark-field imaging

Collaborators (9)

Marco Francesco Mario Stampanoni

Jens Wenzel Andreasen

Daniel Pelt

Matthieu N. Boone

Veerle Cnudde

Jisoo Kim

Chiara Carminati

Andrei Faraon

Jan Aelterman

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