Montserrat Nafria

Full Professor

University of Barcelona

Spain

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Montserrat Nafria is a Full Professor at Universitat Autonoma Barcelona. Based in Spain, her research focuses on topics such as physical unclonable functions, reliability assessment of optical devices, and resistive switching phenomena in transistors. She has contributed significantly to the understanding of noise effects in memristor-based systems and the aging impacts on organic thin film transistors. Her recent publications reflect a strong emphasis on nanoscale characterization and the development of measurement systems for advanced electronic devices.

Articles (17)

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2025

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2020

Collaborators (7)

Albert Cirera

Professor

University of Barcelona

SPAIN

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Francisco V. Fernández

SPAIN

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Georgios Ch. Sirakoulis

Democritus University of Thrace

GREECE

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Xavier Aragones

Associate Professor

Universitat Politècnica de Catalunya

SPAIN

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Javier martin

Universitat Autònoma de Barcelona (UAB)

SPAIN

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Vasileios Ntinas

Assistant Professor

Aalborg University

DENMARK

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Diego Mateo

Assistant Professor

Universitat Politècnica de Catalunya

SPAIN

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Montserrat Nafria

Research Interests

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About

Articles (17)

Physical Unclonable Functions Based on the Post-Breakdown Current of FDSOI Nanowire Transistors

Reliability Assessment of Optical Physical Unclonable Functions Based on the Spatial Distribution of Catastrophic Failure Sites in MIM Structures

Resistive Switching phenomenon in FD-SOI Ω-Gate FETs: Transistor performance recovery and back gate bias influence

Noise-Induced Homeostasis in Memristor-Based Neuromorphic Systems

Stochastic Resonance in HfO₂-Based Memristors: Impact of External Noise on the Binary STDP Protocol

On the Aging of OTFTs and Its Impact on PUFs Reliability

A Smart Measurement System for the Combined Nanoscale and Device Level Characterization of Electron Devices: Implementation Using Ink-Jet Printing Technologies

Random Telegraph Noise and Bias Temperature Instabilities statistical characterization of Ω-gate FDSOI devices at low voltages

Exploitation of OTFTs variability for PUFs implementation and impact of aging

Oxide Breakdown Spot Spatial Patterns as Fingerprints for Optical Physical Unclonable Functions

Impact of OFF-State, HCI and BTI degradation in FDSOI Ω-gate NW-FETs

Determination of the Time Constant Distribution of a Defect-Centric Time-Dependent Variability Model for Sub-100-nm FETs

On the Impact of the Biasing History on the Characterization of Random Telegraph Noise

Aging in CMOS RF Linear Power Amplifiers: An Experimental Study

Statistical Characterization of Time-Dependent Variability Defects Using the Maximum Current Fluctuation

Methodology for the Simulation of the Variability of MOSFETs With Polycrystalline High-k Dielectrics Using CAFM Input Data

DC Characterization and Fast Small-Signal Parameter Extraction of Organic Thin Film Transistors With Different Geometries

Collaborators (7)

Albert Cirera

Francisco V. Fernández

Georgios Ch. Sirakoulis

Xavier Aragones

Javier martin

Vasileios Ntinas

Diego Mateo

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