Naresh Gunasekar

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Lecturer

Cardiff University

United Kingdom

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Recent Grants

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Quantitative non-destructive nanoscale characterisation of advanced materials

Open Date: 2017-05-31

Close Date: 2020-11-30

Grant: Close

Understanding the role of threading dislocations in nitride thin films for optoelectronic device applications

Open Date: 2013-08-01

Close Date: 2013-09-01

Articles (11)

Year:

2024

Year:

2022

Year:

2022

Year:

2021

Year:

2021

Year:

2021

Year:

2020

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2020

Year:

2020

Year:

2020

Year:

2020

Collaborators (11)

Jonathan McKendry

University Of Strathclyde

UNITED KINGDOM

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Raphael Müller

Ulm University

GERMANY

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Benjamin Hourahine

University Of Strathclyde

UNITED KINGDOM

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Philip Shields

University of Bath

UNITED KINGDOM

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Winston Schoenfeld

Professor

University of Central Florida

UNITED STATES

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Martin Dawson

University Of Strathclyde

UNITED KINGDOM

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Jochen Bruckbauer

University Of Strathclyde

UNITED KINGDOM

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Matthew Smith

Trainer, Researcher

University of Bristol

UNITED KINGDOM

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Robert Martin

University Of Strathclyde

UNITED KINGDOM

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Angus J. Wilkinson

UNITED KINGDOM

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Carol Trager-Cowan

University Of Strathclyde

UNITED KINGDOM

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Naresh Gunasekar

Research Interests

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Recent Grants

Articles (11)

Simultaneous mapping of cathodoluminescence spectra and backscatter diffraction patterns in a scanning electron microscope

Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light–electron microscopy

Role of defects in ultra-high gain in fast planar tin gallium oxide UV-C photodetector by MBE

Correlation between deep-level defects and functional properties of β-(SnxGa1-x)2O3 on Si photodetectors

High Figure‐of‐Merit Gallium Oxide UV Photodetector on Silicon by Molecular Beam Epitaxy: A Path toward Monolithic Integration

Origin of Red Emission in β‐Ga2O3 Analyzed by Cathodoluminescence and Photoluminescence Spectroscopy

Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope

Luminescence behavior of semipolar (10-11) InGaN/GaN "bow-tie" structures on patterned Si substrates

Metrology of crystal defects through intensity variations in secondary electrons from the diffraction of primary electrons in a scanning electron microscope

Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope

AlN overgrowth of nano-pillar-patterned sapphire with different offcut angle by metalorganic vapor phase epitaxy

Collaborators (11)

Jonathan McKendry

Raphael Müller

Benjamin Hourahine

Philip Shields

Winston Schoenfeld

Martin Dawson

Jochen Bruckbauer

Matthew Smith

Robert Martin

Angus J. Wilkinson

Carol Trager-Cowan

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