Nicolas Verrier

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Associate Professor

Université de Haute-Alsace
Country flagFrance

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About

Dr. Nicolas Verrier is an Associate Professor at Université de Haute-Alsace in France. His research primarily focuses on advancements in tomographic microscopy techniques, including diffraction microscopy and super-resolution imaging. Dr. Verrier has contributed to various recent articles addressing topics such as polarised array sensors, multimodal image reconstruction, and optimization of sample illumination for different microscopy modalities.

Recent Grants

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Temporally Heterodyned Theta Tomographic Microscopy – THTTM

Open Date: 2019-12-20

Close Date: 2023-12-19

Articles (8)

Optical microscopy techniques are among the most used methods in biomedical sample characterization. In their more advanced realization, optical microscopes demonstrate resolution down to the nanometric scale. These methods rely on the use of fluorescent sample labeling in order to break the diffraction limit. However, fluorescent molecules’ phototoxicity or photobleaching is not always compatible with the investigated samples. To overcome this limitation, quantitative phase imaging techniques have been proposed. Among these, holographic imaging has demonstrated its ability to image living microscopic samples without staining. However, for a 3D assessment of samples, tomographic acquisitions are needed. Tomographic Diffraction Microscopy (TDM) combines holographic acquisitions with tomographic reconstructions. Relying on a 3D synthetic aperture process, TDM allows for 3D quantitative measurements of the complex refractive index of the investigated sample. Since its initial proposition by Emil Wolf in 1969, the concept of TDM has found a lot of applications and has become one of the hot topics in biomedical imaging. This review focuses on recent achievements in TDM development. Current trends and perspectives of the technique are also discussed.

Year:

2024

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2023

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2023

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2023

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2022

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2022

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2021

Year:

2021

Collaborators (4)

Vasily N. Astratov

-

UNITED STATES
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Bertrand SIMON

assistant professor

Institut d'Optique Graduate School

FRANCE
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Mikko Huttunen

University of Tampere

FINLAND
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Olivier Haeberlé

Université de Haute-Alsace

FRANCE
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