Olivier Thomas

Professeur

Aix-Marseille University

France

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Olivier Thomas is a Professor at Aix-Marseille Université in France. His research focuses on advanced materials and nanotechnology, with recent articles highlighting topics such as phase transformations in doped zirconia, nanowire behavior, and crystallization kinetics of thin films. His expertise includes electron microscopy, X-ray diffraction techniques, and the mechanical properties of nano-structured materials.

Articles (15)

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2025

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2025

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2025

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2025

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2024

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2023

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2023

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2023

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2022

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2022

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2022

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2022

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2021

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2020

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2020

Collaborators (5)

Matthieu Bugnet

CNRS

FRANCE

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Jonathan Amodeo

CNRS Délégation Côte d'Azur

FRANCE

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NAGARAJAN RAGHAVAN

Assistant Professor

Singapore University of Technology and Design

SINGAPORE

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Souren Grigorian

Technische Universität Dortmund Fakultät Physik

GERMANY

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Arief Budiman

Assistant Professor

Singapore University of Technology and Design

SINGAPORE

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Olivier Thomas

Research Interests

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Articles (15)

Correlated X‐Ray and Electron Microscopies of a Single Biphasic GaAs Nanowire

Phase transformation in Ce-Doped zirconia single and oligo-crystals: In-situ micro-compression with electron back-scattered diffraction analysis

Three-point bending behavior of individual ZnO nanowires studied by in situ Laue microdiffraction

Influence of an underlayer on the crystallization of thin Ge-rich Ge–Sb–Te films

Influence of surface roughness on the deformation of gold nanoparticles under compression

Crystallization kinetics from Ge-rich Ge–Sb–Te thin films: Influence of thickness

Kinematic scattering by nanocrystals

Investigation of the reliability of nano-nickel/niobium oxide-based multilayer thin films deposited on polymer substrates for flexible electronic applications

In Situ Nano-Indentation of a Gold Sub-Micrometric Particle Imaged by Multi-Wavelength Bragg Coherent X-ray Diffraction

X-ray Diffraction Imaging of Deformations in Thin Films and Nano-Objects

Time-resolved piezoelectric response in relaxor ferroelectric (Pb0.88La0.12)(Zr0.52Ti0.48)O3 thin films

Crystallographic Anisotropy Dependence of Interfacial Sliding Phenomenon in a Cu(16)/Nb(16) ARB (Accumulated Rolling Bonding) Nanolaminate

Simultaneous Multi-Bragg Peak Coherent X-ray Diffraction Imaging

Piezoelectric Properties of Pb1−xLax(Zr0.52Ti0.48)1−x/4O3 Thin Films Studied by In Situ X-ray Diffraction

Direct Observations of the Structural Properties of Semiconducting Polymer: Fullerene Blends under Tensile Stretching

Collaborators (5)

Matthieu Bugnet

Jonathan Amodeo

NAGARAJAN RAGHAVAN

Souren Grigorian

Arief Budiman

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