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Osami Wada

Researcher, Visiting Professor

Nagoya Institute of Technology

Japan

Research Interests

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Professors in Japan

About

Osami Wada is a Visiting Professor and Researcher at Nagoya Institute of Technology, Japan. His research interests include digital low-dropout regulators, on-chip power integrity, and nonlinear characteristics of DC/DC converters. He has authored several articles addressing topics such as power distribution networks and transmission line models, contributing significantly to the fields of electrical engineering and energy transfer.

Articles (12)

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2026

Year:

2024

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2023

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2023

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2023

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2022

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2022

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2021

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2021

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2020

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2020

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2020

Collaborators (4)

Yusuke Yano

Nagoya Institute of Technology

JAPAN

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Takashi Hisakado

准教授 / Associate Professor

Kyoto University

JAPAN

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Mahfuzul Islam

Junior Associate Professor

Kyoto University

JAPAN

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Tohlu Matsushima

Professor

Kyushu Institute of Technology

JAPAN

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Osami Wada

Research Interests

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Articles (12)

Analysis of Grounding Structure Effects on Automotive Ethernet Using Unshielded Twisted Pair: Experimental and Simulation Study Under Bulk Current Injection Testing

A Fully Integrated Digital LDO With Adaptive Sampling and Statistical Comparator Selection

On-Chip Power Integrity Simulation Using LSI-Core Macromodels Considering Voltage Fluctuations Caused by Inter-Function-Block Interference

Global stabilization for nonlinear two-port characteristics of bidirectional DC/DC converter and its application to peer-to-peer energy transfer

Single-Conductor Transmission-Line Model for Bent Wire Structures

Compensating Method of Equivalent Current Sources of LSI-Core Macromodel Considering Voltage Fluctuations in On-Chip Power Distribution Network

Low-Power Design of Digital LDO With Nonlinear Symmetric Frequency Generation

Single-Conductor Transmission Line Model Incorporating Radiation Reaction

Fault location in 6.6 kV overhead distribution system by comparing TDR waveforms before and after failure

Experimental investigation of communication quality degradation of 1000BASE-T1 by pulse disturbance

Differential-/Common-Mode Conversion Loss and LCL/TCL Measurement Methods

Tdr measurement with corresponding to utility-pole span resolution for fault location in real-scale distribution system

Collaborators (4)

Yusuke Yano

Takashi Hisakado

Mahfuzul Islam

Tohlu Matsushima

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