Rüdiger Schmidt-Grund

Ilmenau University of Technology

Germany

Research Interests

Explore related searches

Professors in Germany

Contact this professor

Get a free first email built on one of their papers, ready for you to edit and send yourself.

Articles (13)

Year:

2025

Year:

2024

Year:

2024

Year:

2022

Year:

2022

Year:

2021

Year:

2021

Year:

2020

Year:

2020

Year:

2020

Year:

2020

Year:

2020

Year:

2020

Collaborators (4)

Stefan Zollner

UNITED STATES

View details

Shirly Espinoza

FZU - Institute of Physics of the Czech Academy of Sciences

CZECH REPUBLIC

View details

Jan Philipp Hofmann

Professor

Technische Universität Darmstadt

GERMANY

View details

Clement Maheu

Institut des Matériaux Jean Rouxel

FRANCE

View details

ApplyKite TwinLearns as you apply

Make your next move.

Prepare your application

Review drafts before you send them.

Rüdiger Schmidt-Grund

Research Interests

Explore related searches

Contact this professor

Articles (13)

Ultrafast Exciton and Charge Carrier Dynamics in Monolayer MoS<sub>2</sub> Measured with Time‐Resolved Spectroscopic Ellipsometry

Integration of Multijunction Absorbers and Catalysts for Efficient Solar‐Driven Artificial Leaf Structures: A Physical and Materials Science Perspective

Electronic Structure and Stability of the Active Surface Phase of Ni<sub><i>x</i></sub>Co<sub>3–<i>x</i></sub>O<sub>4</sub> Spinel Alkaline O<sub>2</sub> Evolution Electrocatalysts: From an Epitaxial Model Catalyst Perspective

Coherent acoustic phonon oscillations and transient critical point parameters of Ge from femtosecond pump‐probe ellipsometry

Ellipsometry and polarimetry - classical measurement techniques with always new developments, concepts, and applications

Transient birefringence and dichroism in ZnO studied with fs-time-resolved spectroscopic ellipsometry

Broadband femtosecond spectroscopic ellipsometry

Influence of the excitation conditions on the emission behavior of carbon nanodot-based planar microcavities

Hybrid GA-gradient method for thin films ellipsometric data evaluation

Control of magnetic properties in spinel ZnFe2O4 thin films through intrinsic defect manipulation

Ultrafast dynamics of hot charge carriers in an oxide semiconductor probed by femtosecond spectroscopic ellipsometry

Impact of Defects on Magnetic Properties of Spinel Zinc Ferrite Thin Films

Molybdenum silicide in infrared emitting devices

Collaborators (4)

Stefan Zollner

Shirly Espinoza

Jan Philipp Hofmann

Clement Maheu

Make your next move.