Yiyang Li

University of Michigan

United States

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Articles (17)

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2025

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2025

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2025

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2025

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2025

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2025

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2025

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2025

We quantified the oxygen tracer diffusion in amorphous hafnium oxide thin films. These tracer diffusion values are consistent with the experimentally measured retention times of hafnium oxide resistive memory devices.

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2024

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2024

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2024

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2023

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2023

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2023

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2022

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2021

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2020

Collaborators (2)

Jason Siegel

University of Michigan

UNITED STATES

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Timothy Brown

Oklahoma State University

UNITED STATES

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Yiyang Li

Research Interests

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Articles (17)

Mechanisms enabling reconfigurability and long-term retention in vanadium oxide electrochemical memory

Beryllium-incorporated ScAlN/GaN HEMTs with low off-current and high current stress stability

(Invited) Nonvolatile Electrochemical Memory Enabled by Phase Separation in Tantalum Oxide

(Invited) Quantifying Cathode Kinetics Using Single-Particle Electrochemistry

High-Throughput Investigation of Zinc Electrodeposition Morphology Using Microelectrode Arrays

Microelectrode Arrays for Electrochemical Cycling of Individual Battery Particles

Nonvolatile electrochemical memory at 600°C enabled by composition phase separation

Electrochemical Random-Access Memory: Progress, Perspectives, and Opportunities

Oxygen tracer diffusion in amorphous hafnia films for resistive memory

Microelectrodes for Battery Materials

Single‐Particle Electrochemical Cycling Single‐Crystal and Polycrystalline NMC Particles

Direct measurements of size-independent lithium diffusion and reaction times in individual polycrystalline battery particles

Learning heterogeneous reaction kinetics from X-ray videos pixel by pixel

Nonvolatile Electrochemical Random‐Access Memory under Short Circuit

ECRAM Materials, Devices, Circuits and Architectures: A Perspective

Highly Efficient Uniaxial In‐Plane Stretching of a 2D Material via Ion Insertion

Filament‐Free Bulk Resistive Memory Enables Deterministic Analogue Switching

Collaborators (2)

Jason Siegel

Timothy Brown

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