Yusuke Wakabayashi

Professor

Tohoku University

Japan

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Yusuke Wakabayashi is a Professor at Tohoku University in Japan. His research spans a variety of topics including optoelectronic characteristics of organic materials, charge transfer measurements in oxide interfaces, and the investigation of dynamical processes in ionic glasses. His recent works include studies on metal-organic ladder compounds and the structural properties of complex oxide films.

Articles (17)

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2025

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2025

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2025

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2024

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2024

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2024

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2024

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2023

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2022

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2022

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2022

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2021

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2021

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2021

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2020

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2020

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2020

Collaborators (7)

Yuta Ishii

Assistant professor

Tohoku University

JAPAN

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Naotaka Kasuya

Sumitomo Electric Industries (Japan)

JAPAN

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Takuya Aoyama

Tohoku University

JAPAN

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Wataru Norimatsu

Professor

Waseda University

JAPAN

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Hiroshi KUMIGASHIRA

Professor

Tohoku University

JAPAN

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Takayoshi Katase

Associate Professor

Tokyo Institute of Technology

JAPAN

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Hirotake Itoh

Tohoku University

JAPAN

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Yusuke Wakabayashi

Research Interests

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Articles (17)

Structural, Photophysical, and Distributed Feedback Lasing Characteristics of Furan-Substituted Thiophene/Phenylene Co-Oligomer Single Crystals

Non-destructive measurement of the charge transfer across LaMnO3/SrTiO3 interfaces

Discovery of collective nonjumping motions leading to Johari–Goldstein process of stress relaxation in model ionic glass

Symmetry change in LaNiO3 films caused by epitaxial strain from LaAlO3, SrTiO3, and DyScO3 pseudocubic (001) surfaces

A Three‐Dimensionally Extended Metal–Organic Ladder Compound Exhibiting Proton Conduction

Optoelectronic characteristics of furan substituted thiophene/phenylene co-oligomer single crystals for organic lasing

Nonferroelectric phase with loss of cycloidal magnetic structure in Tb0.515Gd0.485Mn2O5

Quantitative measurement of structural fluctuation at LaNiO3/LaAlO3 interfaces as a function of thickness

Light-induced magnetization driven by interorbital charge motion in the spin-orbit assisted Mott insulator α−RuCl3

Phonon dispersion of the organic semiconductor rubrene

Topological charge of soft X-ray vortex beam determined by inline holography

Local polarization and valence distribution in LaNiO3 / LaMnO3 heterostructures

Spin reorientation in tetragonally distorted spinel oxide NiCo2O4 epitaxial films

Erratum: Robust surface structure analysis with reliable uncertainty estimation using the exchange Monte Carlo method. Corrigendum (J. Appl. Cryst. (2020) 53 (387–392) DOI: 10.1107/S1600576720001314)

Structure of quasi-free-standing graphene on the SiC (0001) surface prepared by the rapid cooling method

Metallic ground states of undoped Ti<sub>2</sub>O<sub>3</sub> films induced by elongated c-axis lattice constant.

Multiple magnetic order parameters coexisting in multiferroic hexaferrites resolved by soft x rays

Collaborators (7)

Yuta Ishii

Naotaka Kasuya

Takuya Aoyama

Wataru Norimatsu

Hiroshi KUMIGASHIRA

Takayoshi Katase

Hirotake Itoh

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