Alessandro Paccagnella

professor

University of Padua

Italy

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Alessandro Paccagnella is a professor at the University of Padua, Italy. His research focuses on topics including radiation qualification methodologies, total ionizing dose effects in power electronics, and biosensing applications related to Chagas disease. He has contributed significantly to the understanding of single event transients in advanced semiconductor technologies and their implications in both electronics and the agri-food industry.

Articles (26)

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2025

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2021

Collaborators (10)

Simone Gerardin

University of Padua

ITALY

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Stefano Bonaldo

University of Padova

ITALY

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Stefano Casalini

Associate professor

University of Padua

ITALY

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Emilio Sardini

Full Professor -Director

University of Brescia

ITALY

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Ronald Schrimpf

Professor

Vanderbilt University

UNITED STATES

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Andrea Baschirotto

ITALY

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Claudio Narduzzi

University of Padua

ITALY

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Mauro Serpelloni

Professore

University of Brescia

ITALY

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Alessandro Zimmaro

European Organization for Nuclear Research

SWITZERLAND

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Lei Zhao

Institut Català de Nanociència i Nanotecnologia

SPAIN

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Alessandro Paccagnella

Research Interests

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About

Articles (26)

COTS BJT Radiation Qualification Methodology for Highly Distributed Systems in Mixed-Field Environments

Total-Ionizing-Dose and Displacement Damage Effects in Trench SiC Power MOSFETs

Quantitative Analysis on Multi-Factor Coupling Influence Effects of Single Event Transient Characteristic Dependence of 22-nm FDSOI Circuits

Displacement Damage and Total Ionizing Dose Induced by 3-MeV Protons in SiC Vertical Power MOSFETs

Plasmonic Biosensor of Cruzipain-Antibody Complexes Based on Gold-Nanogratings for Chagas Disease Screening

On the Vulnerability of UMOSFETs in Terrestrial Radiation Environments

Monitoring of Lactococcus Lactis Growth Based on Reduced-Graphene Oxide TFT for Dairy Industry Applications

Multiphysics Modeling of the Electrochemical Response of Screen-Printed Electrodes for Sensing Applications

Impact of Tier Pitch Scaling on Heavy-Ion Sensitivity of 3-D NAND Flash Memories

Influence of Surface Passivation on Campylobacter jejuni Specificity of an Impedimetric Genosensor for Poultry Infection Monitoring in Agri-Food Industry

Bacteria-Based Biosensor for the Detection of Lactococcus Lactis Bacteriophage in Agrifood Industry

Depth Dependence of Neutron-Induced Errors in 3-D NAND Floating Gate Cells

Radiation-Induced Charge Trapping in Shallow Trench Isolations of FinFETs

Radiation-Induced Effects in SiC Vertical Power MOSFETs Irradiated at Ultrahigh Doses

Total Ionizing Dose Effects in 3-D NAND Replacement Gate Flash Memory Cells

Impedimetric Screen-Printed Immunosensor for the Rapid Detection of Chagas Disease

Total-Ionizing-Dose Effects at Ultrahigh Doses in AlGaN/GaN HEMTs

Single Event Effects in 3-D NAND Flash Memory Cells With Replacement Gate Technology

Screen-Printed Electrochemical Biosensor for the Detection of Bacteriophage of Lactococcus Lactis for Dairy Production

Influence of BSA Protein on Electrochemical Response of Genosensors

Amperometric Measurements by a Novel Aerosol Jet Printed Flexible Sensor for Wearable Applications

A plug, print & play inkjet printing and impedance-based biosensing technology operating through a smartphone for clinical diagnostics

Increased Device Variability Induced by Total Ionizing Dose in 16-nm Bulk nFinFETs

Secondary Particles Generated by Protons in 3-D nand Flash Memories

TID Degradation Mechanisms in 16-nm Bulk FinFETs Irradiated to Ultrahigh Doses

A Heavy-Ion Beam Monitor Based on 3-D NAND Flash Memories

Collaborators (10)

Simone Gerardin

Stefano Bonaldo

Stefano Casalini

Emilio Sardini

Ronald Schrimpf

Andrea Baschirotto

Claudio Narduzzi

Mauro Serpelloni

Alessandro Zimmaro

Lei Zhao

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