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Antoine Salih Alj

Associate Professor

ISAE-SUPAERO

France

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About

Antoine Salih Alj is an Associate Professor at ISAE-SUPAERO in France. His research primarily focuses on the effects of displacement damage in CCD-on-CMOS image sensors, including studies on dark current, charge transfer inefficiency, and total ionizing dose effects. He has published several articles that explore these areas, contributing significantly to the advancement of low-light-level imaging technologies.

Articles (9)

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2025

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2025

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2025

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2024

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2024

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2023

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2023

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2023

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2023

Collaborators (1)

Vincent Goiffon

Full Professor

ISAE-SUPAERO

FRANCE

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Antoine Salih Alj

Research Interests

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Articles (9)

Displacement Damage Effects on a CDTI-Based CCD-on-CMOS: Dark Current and Charge Transfer Inefficiency

Displacement Damage-Induced Dark Current and Random Telegraph Signal in p-Type Deep-Trench Pinned Photogates

In-Flight Hot Pixels and Random Telegraph Signal in Aeolus Accumulation CCDs Operated at Low Temperature

Dark Current and Clock-Induced Charges in a Fully Depleted Charge Domain CDTI-Based CCD-on-CMOS Image Sensor

Total Ionizing Dose Effects on a CDTI-Based CCD-on-CMOS Through Buildup of Interface Traps and Oxide Charges

Capacitive Deep Trench Isolation-Based CCD-on-CMOS Image Sensor Sensitivity to Total Ionizing Dose

Capacitive Deep Trench Isolation based CCD-on-CMOS Image Sensor Sensitivity to Total Ionizing Dose

Development of a Charge-Multiplication CMOS Image Sensor Based on Capacitive Trench for Low-Light-Level Imaging

Development of a Charge-Multiplication CMOS Image Sensor Based on Capacitive Trench for Low-Light-Level Imaging

Collaborators (1)

Vincent Goiffon

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