Dariusz Klepacki

This article deals with problems related to electromagnetic compatibility, which is a very important issue due to the fact of ensuring the proper coexistence of devices and systems in a given electromagnetic environment. The devices manufactured today can, on the one hand, be a source of electromagnetic disturbance emissions and, on the other hand, be susceptible to disturbance signals from the environment. A large group of receivers in which electronic specialised circuits are used are LED lamps. The operation of an RGB LED lamp due to higher harmonic current emissions has been analysed in this paper. Lamp tests were carried out in several stages. In each of them, the values of the generated higher harmonics were analysed and related to the parameters of the current flowing through the lamp. It was shown how the parameters of the current pulse affect the generated harmonics when the value of the luminous flux was changed, its colour was changed, or the built-in function was turned on. It is also shown how, for example, changing the value of an electronic component in the lamp’s power supply changes the parameters of the current and thus the value of the generated higher harmonics.

The problem of estimating the deterministic susceptibility coefficient of electronic components to standardised types of electromagnetic disturbance has been presented in this paper. From a theoretical point of view, the problem of damage to electronic elements is presented with the impact of disturbances of critical values on them and the potential impact of this effect on the reliability of the element and ultimately the system or electronic device. For a selected exemplary electronic component, a method for estimating the susceptibility coefficient according to the developed methodology is discussed. Experimental tests were carried out by exposing the test component to a standardised surge of 1.2/50 μs which was observed in an electrical grid. In order to illustrate the developed method, aimed at describing the immunity of an electronic component to a standardised type of disturbance, a signal diode was selected for testing. Using this element as an example, it is shown how, using statistical techniques, the coefficient of its susceptibility to a specific type of disturbance can be estimated.