Kazimierz Kamuda

The problem of estimating the deterministic susceptibility coefficient of electronic components to standardised types of electromagnetic disturbance has been presented in this paper. From a theoretical point of view, the problem of damage to electronic elements is presented with the impact of disturbances of critical values on them and the potential impact of this effect on the reliability of the element and ultimately the system or electronic device. For a selected exemplary electronic component, a method for estimating the susceptibility coefficient according to the developed methodology is discussed. Experimental tests were carried out by exposing the test component to a standardised surge of 1.2/50 μs which was observed in an electrical grid. In order to illustrate the developed method, aimed at describing the immunity of an electronic component to a standardised type of disturbance, a signal diode was selected for testing. Using this element as an example, it is shown how, using statistical techniques, the coefficient of its susceptibility to a specific type of disturbance can be estimated.