David Taylor

The Theory of Critical Distances (TCD) has undoubtedly represented a breakthrough in the brittle failure assessment of engineering materials containing defects, crack, or notches. The basic idea on which the simplest formulation of the TCD is based is to evaluate an effective stress at a characteristic distance from the tip of the defect/crack/notch and compare it with an inherent fracture strength. Is the critical distance related to the material (micro) structure? Whereas a correlation was already proved for homogeneous materials, the current attention to nonhomogeneous ones has brought the question back to the fore. The goal of the present work is therefore twofold: (i) to extend the use of the TCD, through the simple yet effective Point Method (PM), for the static failure assessment of inhomogeneous materials, such as cellular, biological, and additively manufactured (AM) materials; and (ii) to look for a correlation between critical distance and internal (micro) structure.