Guido Groeseneken

Part-time Professor

KU Leuven

Belgium

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Guido Groeseneken is a Part-time Professor at KU Leuven, Belgium. His research areas include semiconductor technology, specifically focusing on advanced device reliability, ESD mechanisms, and ferroelectric materials. Recent publications highlight his work on topics such as 3-nm technology optimization, latch-up risks, and hot-carrier effects in advanced FET structures.

Articles (12)

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2024

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2024

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2023

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2023

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2023

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2022

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2022

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2021

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2021

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2021

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2021

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2021

Collaborators (3)

Bertrand Parvais

Vrije Universiteit Brussel

BELGIUM

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Nadine Collaert

Vrije Universiteit Brussel

BELGIUM

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Benoit Bakeroot

Researcher/Professor

Ghent University

BELGIUM

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Guido Groeseneken

Research Interests

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Articles (12)

Impact of Sub-μm Wafer Thinning on Latch-Up Risk in DTCO/STCO Scaling Era

A 1.8-V GPIO With Design-Technology-Reliability Co-Optimization in Sub-3-nm GAA-NS Technology

ON-State Human Body Model ESD Failure Mechanisms in GaN-on-Si RF MIS-HEMTs

Trapping of Hot Carriers in the Forksheet FET Wall: A TCAD Study

Variability in Planar FeFETs—Channel Percolation Impact

ESD nMOSFETs in Advanced Bulk FinFET Technology With Dual S/D Epitaxy

LaSiO x - and Al2O3-Inserted Low-Temperature Gate-Stacks for Improved BTI Reliability in 3-D Sequential Integration

Investigating the Current Collapse Mechanisms of p-GaN Gate HEMTs by Different Passivation Dielectrics

Investigation of the Impact of Hot-Carrier-Induced Interface State Generation on Carrier Mobility in nMOSFET

Compact Modeling of Multidomain Ferroelectric FETs: Charge Trapping, Channel Percolation, and Nucleation-Growth Domain Dynamics

Modeling of Repeated FET Hot-Carrier Stress and Anneal Cycles Using Si–H Bond Dissociation/Passivation Energy Distributions

Effects of Back-Gate Bias on the Mobility and Reliability of Junction-Less FDSOI Transistors for 3-D Sequential Integration

Collaborators (3)

Bertrand Parvais

Nadine Collaert

Benoit Bakeroot

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