Matthias Alfeld
Assistant Professor
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About
Matthias Alfeld is an Assistant Professor at Delft University of Technology, Netherlands. His research areas include neural network simulation in art conservation, classification systems for Modernist painters, and multivariate analysis of hyperspectral datasets in the cultural heritage field. Recent articles illustrate his focus on pigment analysis and preservation techniques, particularly in relation to historical paintings and artifacts.
Articles (12)
Year:
2025
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2025
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2024
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2023
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2023
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2023
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2023
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2022
X-ray fluorescence spectroscopy (XRF) plays an important role for elemental analysis in a wide range of scientific fields, especially in cultural heritage.
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2022
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2022
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2021
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2021
Collaborators (3)
Raf Van de Plas
Associate Professor
Delft University of Technology
Marc Walton
Northwestern University
Matteo Spagnuolo
University of Bari
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