Matthias Alfeld

Assistant Professor

Delft University of Technology
Country flagNetherlands

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About

Matthias Alfeld is an Assistant Professor at Delft University of Technology, Netherlands. His research areas include neural network simulation in art conservation, classification systems for Modernist painters, and multivariate analysis of hyperspectral datasets in the cultural heritage field. Recent articles illustrate his focus on pigment analysis and preservation techniques, particularly in relation to historical paintings and artifacts.

Articles (12)

Year:

2025

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2025

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2024

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2023

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2023

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2023

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2023

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2022

X-ray fluorescence spectroscopy (XRF) plays an important role for elemental analysis in a wide range of scientific fields, especially in cultural heritage.

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2022

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2022

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2021

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2021

Collaborators (3)

Raf Van de Plas

Associate Professor

Delft University of Technology

NETHERLANDS
View details

Marc Walton

Northwestern University

UNITED STATES
View details

Matteo Spagnuolo

University of Bari

ITALY
View details
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