Moritz Fieback

Delft University of Technology

Netherlands

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Articles (6)

Year:

2022

Year:

2021

Year:

2021

Year:

2021

Year:

2021

Year:

2020

Collaborators (4)

Tobias Gemmeke

RWTH Aachen University

GERMANY

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Arnaud Virazel

Head of TEST team

FRANCE

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Mathieu Moreau

Associate professor

Aix-Marseille University

FRANCE

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Mottaqiallah Taouil

Delft University of Technology

NETHERLANDS

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Moritz Fieback

Research Interests

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Articles (6)

Defects, Fault Modeling, and Test Development Framework for RRAMs

Multi-Level Control of Resistive RAM (RRAM) Using a Write Termination to Achieve 4 Bits/Cell in High Resistance State

Hard-to-Detect Fault Analysis in FinFET SRAMs

Review of Manufacturing Process Defects and Their Effects on Memristive Devices

Defect and Fault Modeling Framework for STT-MRAM Testing

An Energy-Efficient Current-Controlled Write and Read Scheme for Resistive RAMs (RRAMs)

Collaborators (4)

Tobias Gemmeke

Arnaud Virazel

Mathieu Moreau

Mottaqiallah Taouil

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