Paweł Michałowski

Head of department, SIMS expert

Łukasiewicz Research Network - Institute of Microelectronics and Photonics

Poland

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Articles (10)

Year:

2024

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2024

Year:

2024

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2024

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2024

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2024

Year:

2023

Year:

2023

Year:

2023

Year:

2023

Collaborators (13)

Bartłomiej J. Jankiewicz

Military University of Technology

POLAND

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Humeyra Caglayan

University of Tampere

FINLAND

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Peter Pichler

Associate Lecturer

Friedrich-Alexander Universität Erlangen-Nürnberg

GERMANY

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Agnieszka Torzewska

University of Łódź

POLAND

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Sebastian Zlotnik

Assistant Professor

Military University of Technology in Warsaw

POLAND

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Rémi DEMOULIN

Normandie Université

FRANCE

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Jarosław Wróbel

POLAND

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Alessandro Pianelli

University of Tampere

FINLAND

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Adrianna Wójcik

Sieć Badawcza Łukasiewicz Instytut Mikroelektroniki i Fotoniki

POLAND

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Łukasz Ciura

Rzeszów University

POLAND

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Malwina Liszewska

Military University of Technology

POLAND

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Jolanta Prywer

Lodz University of Technology

POLAND

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Jonas Müller

LATMOS-CNRS

FRANCE

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Paweł Michałowski

Research Interests

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Articles (10)

Artifact-free secondary ion mass spectrometry profiling of a full vertical cavity surface emitting laser structure

Dispersion and incorporation of TiO<sub>2</sub> and SiC nano-particles in SAC alloy: SIMS and DFT study

Selective etching of multilayer graphene with ultra-low impact energy oxygen ions

TCAD modeling and simulation of self-limiting oxide growth and boron segregation during vertical silicon nanowire processing

TiO<sub>2</sub>/PDA Multilayer Nanocomposites with Exceptionally Sharp Large-Scale Interfaces and Nitrogen Doping Gradient

Ultrafast optical properties of stoichiometric and non-stoichiometric refractory metal nitrides TiN<sub>x</sub>, ZrN<sub>x</sub>, and HfN<sub>x</sub>

From DFT investigations of oxygen-implanted molybdenum disulfide to temperature-induced stabilization of MoS2/MoO3 heterostructure

Insights into the physical and chemical properties of struvite crystal surfaces in terms of the effectiveness of bacterial adhesion

Multi-technique characterisation of InAs-on-GaAs wafers with circular defect pattern

Impact of surface reflectivity on the ultra-fast laser melting of silicon-germanium alloys

Collaborators (13)

Bartłomiej J. Jankiewicz

Humeyra Caglayan

Peter Pichler

Agnieszka Torzewska

Sebastian Zlotnik

Rémi DEMOULIN

Jarosław Wróbel

Alessandro Pianelli

Adrianna Wójcik

Łukasz Ciura

Malwina Liszewska

Jolanta Prywer

Jonas Müller

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