Adrianna Wójcik

Sieć Badawcza Łukasiewicz Instytut Mikroelektroniki i Fotoniki

Poland

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Articles (11)

Year:

2025

Year:

2025

Year:

2023

Year:

2022

Year:

2022

Year:

2022

Year:

2022

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2022

Year:

2021

Year:

2021

Year:

2021

Collaborators (9)

Johannes Binder

University of Warsaw

POLAND

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Jakub Sitek

Assistant Professor

University of Warsaw

POLAND

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Joanna Kargul

Professor, Group Leader

University of Warsaw

POLAND

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Andrzej Wysmołek

Professor

faculty of physics university of warsaw warsaw poland

POLAND

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STRACHOWSKI Tomasz

Head of Laboratory

Institute of Electronic Materials Technology

POLAND

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Frank Peters

University College Cork

IRELAND

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Margot Jacquet

University of Warsaw

POLAND

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Roman Stepniewski

Professor

University of Warsaw

POLAND

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Paweł Michałowski

Head of department, SIMS expert

Łukasiewicz Research Network - Institute of Microelectronics and Photonics

POLAND

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Adrianna Wójcik

Research Interests

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Articles (11)

Why ‘Zn diffusion’ is not always diffusion: Surface physics and a 40-year-old epitaxy problem

Suppression of iron oxidation problem into PVDF/PMMA composites with ceramic additives: SiO2 vs. TiO2

From DFT investigations of oxygen-implanted molybdenum disulfide to temperature-induced stabilization of MoS2/MoO3 heterostructure

Empirical indication for desalinating properties of porous boron nitride

Oxycarbide MXenes and MAX phases identification using monoatomic layer-by-layer analysis with ultralow-energy secondary-ion mass spectrometry

Insight into structure-property relationship of organometallic terpyridine wires: Combined theoretical and experimental study

Poly (vinylidene fluoride) solid polymer electrolyte structure revealed by secondary ion mass spectrometry

Precise localization of contaminants in graphene with secondary ion mass spectrometry

Defect-mediated sputtering process of boron nitride during high incident angle low-energy ion bombardment

Electrically active and hydrogen passivated Zn in GaAs/AlGaAs specifically distinguished during secondary ion mass spectrometry depth profiling

Electrically active and hydrogen passivated Zn in GaAs/AlGaAs specifically distinguished during secondary ion mass spectrometry depth profiling

Collaborators (9)

Johannes Binder

Jakub Sitek

Joanna Kargul

Andrzej Wysmołek

STRACHOWSKI Tomasz

Frank Peters

Margot Jacquet

Roman Stepniewski

Paweł Michałowski

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