Stefan Witte

University of Amsterdam

Netherlands

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Articles (19)

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2025

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2022

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2022

Collaborators (7)

Ronnie Hoekstra

Full Professor, groupleader

Zernike Institute for Advanced Materials, Rijksuniversiteit Groningen

NETHERLANDS

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Xiaomeng Liu

University of Amsterdam

NETHERLANDS

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Wim Ubachs

University of Amsterdam

NETHERLANDS

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Edcel John Salumbides

University of Amsterdam

NETHERLANDS

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Paul Planken

University of Amsterdam

NETHERLANDS

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Christos Messinis

University of Amsterdam

NETHERLANDS

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Peter Kraus

Assistant Professor

University of Amsterdam

NETHERLANDS

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Stefan Witte

Research Interests

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Articles (19)

Arbitrary pulse shaping in a mid-infrared optical parametric oscillator source

Optically enhancing and controlling photoacoustic signals using ultra-thin semiconductor coatings on metal surfaces

Characterization of Sub-Optical-Wavelength Structures through Optically Opaque Films Using Picosecond Ultrasonics

Improving signal-to-noise ratios in pump-probe spectroscopy on light-sensitive samples by adapting pulse repetition rates

Far-field optical propagators with user-defined object-plane pixel size for ptychography

Mid-infrared optical parametric chirped-pulse amplifier at 50 W and 38 fs pumped by a high-power Yb-InnoSlab platform

Sub-cycle dynamics in two-color high-harmonic generation from laser-produced plasmas

Understanding photoacoustic signal formation in the presence of transparent thin films

Fast spectroscopic imaging using extreme ultraviolet interferometry

Breaking Abbe’s diffraction limit with harmonic deactivation microscopy

Illumination diversity in multiwavelength extreme ultraviolet ptychography

Characterizing post-compression of mJ-level ultrafast pulses via loose focusing in a gas cell

Computational vibration mitigation using phase interpolation in digital holographic microscopy for overlay metrology

High-resolution wavefront sensing and aberration analysis of multi-spectral extreme ultraviolet beams

Field-position dependent apodization in dark-field digital holographic microscopy for semiconductor metrology

Observation of chromatic effects in high-order harmonic generation

Optimizing pump–probe reflectivity measurements of ultrafast photoacoustics with modulated asynchronous optical sampling

Microdroplet-tin plasma sources of EUV radiation driven by solid-state-lasers (Topical Review)

Pupil apodization in digital holographic microscopy for reduction of coherent imaging effects

Collaborators (7)

Ronnie Hoekstra

Xiaomeng Liu

Wim Ubachs

Edcel John Salumbides

Paul Planken

Christos Messinis

Peter Kraus

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