Arto Javanainen

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Finland

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Unified methodology for Single Event Effect testing

Open Date: 2015-03-01

Close Date: 2016-02-01

Articles (11)

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2023

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2023

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2023

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2023

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2023

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2023

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2023

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2022

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2022

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2022

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2022

Collaborators (5)

Bruno Capoen

Full Professor

Université de Lille

FRANCE

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Luigi Dilillo

University of Montpellier

FRANCE

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Roger Stark

Head of Test Laboratory

SWITZERLAND

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Paul Leroux

Professor

KU Leuven

BELGIUM

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Youcef Ouerdane

Professeur

Université Jean Monnet Saint-Etienne

FRANCE

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Arto Javanainen

Research Interests

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Contact this professor

Recent Grants

Articles (11)

Proton Direct Ionization Upsets at Tens of MeV

Proton Direct Ionization in Sub-Micron Technologies: Test Methodologies and Modeling

High-Energy Proton and Atmospheric-Neutron Irradiations of SiC Power MOSFETs: SEB Study and Impact on Channel and Drift Resistances

Technology Dependence of Stuck Bits and Single-Event Upsets in 110-, 72-, and 63-nm SDRAMs

Proton Direct Ionization in Sub-Micron Technologies: Test Methodologies and Modeling

Effect of 20 MeV Electron Radiation on Long Term Reliability of SiC Power MOSFETs

Proton Irradiation-Induced Reliability Degradation of SiC Power MOSFET

Properties of Gd-Doped Sol-Gel Silica Glass Radioluminescence under Electron Beams

Heavy-ion induced single event effects and latent damages in SiC power MOSFETs

Isotopic Enriched and Natural SiC Junction Barrier Schottky Diodes Under Heavy Ion Irradiation

Proton Direct Ionization in Sub-Micron Technologies: Numerical Method for RPP Parameter Extraction

Collaborators (5)

Bruno Capoen

Luigi Dilillo

Roger Stark

Paul Leroux

Youcef Ouerdane

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