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Ichiko Misumi

National Institute of Advanced Industrial Science and Technology (AIST)

Japan

Research Interests

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Professors in Japan Professors in Condensed Matter Physics Condensed Matter Physics professors in Japan

Articles (12)

Year:

2026

Year:

2025

Year:

2023

Year:

2023

Year:

2022

Year:

2022

Year:

2022

Year:

2022

Year:

2022

Year:

2021

Year:

2021

Year:

2021

Collaborators (4)

Akiko Hirai

Group Leader

National Institute of Advanced Industrial Science and Technology (AIST)

JAPAN

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Tomoo Sigehuzi

National Institute of Advanced Industrial Science and Technology (AIST)

JAPAN

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Ryosuke Kizu

National Institute of Advanced Industrial Science and Technology (AIST)

JAPAN

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Kayori Takahashi

National Institute of Advanced Industrial Science and Technology (AIST)

JAPAN

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Ichiko Misumi

Research Interests

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Articles (12)

New dynamic Zimm-type plot on light scattering measurement for evaluating interaction changes due to salt addition to particle dispersions

Abbe error correction in atomic force microscopy using scanner-angle measurements

Effect of white noise on roughness measurements of self-affine fractals

Enhancing the precision of 3D sidewall measurements of photoresist using atomic force microscopy with a tip-tilting technique

Pitch calibration of standard nanoscale for uncertainty reduction of certified reference materials for SEM image sharpness evaluation and magnification calibration

Correction: Research Activities of Nanodimensional Standards Using Atomic Force Microscopes, Transmission Electron Microscope, and Scanning Electron Microscope at the National Metrology Institute of Japan

Recent Trends in Contact-Type Aerial Surface Roughness Measurement ―Examples by Using a Metrological Atomic Force Microscope―

Effect of specimen processing for transmission electron microscopy on lattice spacing variation in Si specimens

Research Activities of Nanodimensional Standards Using Atomic Force Microscopes, Transmission Electron Microscope, and Scanning Electron Microscope at the National Metrology Institute of Japan

Extension of the probe-tip error evaluation for areal surface roughness measurements using metrological AFM

Calibration of Step Height Standard Using Metrological Atomic Force Microscope

Experimental evaluation of uncertainty in sub-nanometer metrology using transmission electron microscopy due to magnification variation

Collaborators (4)

Akiko Hirai

Tomoo Sigehuzi

Ryosuke Kizu

Kayori Takahashi

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