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Ryosuke Kizu

National Institute of Advanced Industrial Science and Technology (AIST)

Japan

Research Interests

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Professors in Japan Professors in Condensed Matter Physics Condensed Matter Physics professors in Japan

Articles (12)

Year:

2025

Year:

2025

Year:

2023

Year:

2023

Year:

2023

Year:

2023

Year:

2022

Year:

2022

Year:

2022

Year:

2020

Year:

2020

Year:

2020

Collaborators (4)

Akiko Hirai

Group Leader

National Institute of Advanced Industrial Science and Technology (AIST)

JAPAN

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Keita Kobayashi

Senior Researcher

National Institute of Advanced Industrial Science and Technology (AIST)

JAPAN

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Ichiko Misumi

National Institute of Advanced Industrial Science and Technology (AIST)

JAPAN

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Tomoo Sigehuzi

National Institute of Advanced Industrial Science and Technology (AIST)

JAPAN

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Ryosuke Kizu

Research Interests

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Articles (12)

Comparing bottom–up and top–down SI traceability approaches in dimensional nanometrology: reference material measurements using transmission electron microscopy and atomic force microscopy

Abbe error correction in atomic force microscopy using scanner-angle measurements

Effect of white noise on roughness measurements of self-affine fractals

Enhancing the precision of 3D sidewall measurements of photoresist using atomic force microscopy with a tip-tilting technique

Experimental evaluation of usable specimen thickness of Si for lattice imaging by transmission electron microscopy at 300 kV

Developmental framework of line edge roughness reference standards for next-generation functional micro-/nanostructures

Pitch calibration of standard nanoscale for uncertainty reduction of certified reference materials for SEM image sharpness evaluation and magnification calibration

Research Activities of Nanodimensional Standards Using Atomic Force Microscopes, Transmission Electron Microscope, and Scanning Electron Microscope at the National Metrology Institute of Japan

Unbiased line edge roughness measurement using profile-averaging method for precise roughness parameters measurement

Direct comparison of line edge roughness measurements by SEM and a metrological tilting-atomic force microscopy for reference metrology

A standard used for probe-tip diameter evaluation in surface roughness measurements using metrological atomic force microscope

A reference-scan-based method for correcting the nonlinear drift of atomic force microscopy at sub-nanometer precision

Collaborators (4)

Akiko Hirai

Keita Kobayashi

Ichiko Misumi

Tomoo Sigehuzi

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