Jürgen W. Gerlach

Leibniz Institute of Surface Engineering

Germany

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Articles (18)

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2025

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Collaborators (3)

Donat J. As

University of Paderborn

GERMANY

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Andre Anders

Professor

Leipzig University

GERMANY

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Martin Rudolph

Leibniz Institute of Surface Engineering

GERMANY

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Jürgen W. Gerlach

Research Interests

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Articles (18)

Postannealing-induced intermetallic phase formation in NiPt thin films deposited via direct current and high-power impulse magnetron sputtering

Epitaxial growth of Ge2Sb2Te5 thin films on BaF2 substrates at room temperature by pulsed laser deposition

Heteroepitaxial growth of Ga2O3 thin films on Al2O3(0001) by ion beam sputter deposition

Hydrogen permeation through uniaxially strained SiOx barrier thin films photochemically prepared on PET foil substrates

Hydrogen permeation through uniaxially strained SiOx barrier thin films photochemically prepared on PET foil substrates

Toward decoupling the effects of kinetic and potential ion energies: Ion flux dependent structural properties of thin (V,Al)N films deposited by pulsed filtered cathodic arc

Nitrogen isotope marker experiments in austenitic stainless steel for identification of trapping/detrapping processes at different temperatures

Ion beam sputter deposition of SiO2 thin films using oxygen ions

Role of Reaction Intermediate Diffusion on the Performance of Platinum Electrodes in Solid Acid Fuel Cells

Effect of target peak power density on the phase formation, microstructure evolution, and mechanical properties of Cr2AlC MAX-phase coatings

Epitaxial layered Sb2Te3 thin films for memory and neuromorphic applications

Properties of indium tin oxide thin films grown by Ar ion beam sputter deposition

Role of Reaction Intermediate Diffusion on the Performance of Platinum Electrodes in Solid Acid Fuel Cells

Molecular Beam Epitaxy Growth and Characterization of Germanium‐Doped Cubic AlxGa1−xN

Molecular Beam Epitaxy Growth and Characterization of Germanium-Doped Cubic AlxGa1-xN

Biaxially Textured Titanium Thin Films by Oblique Angle Deposition: Conditions and Growth Mechanisms

Depth-Resolved Phase Analysis of Expanded Austenite Formed in Austenitic Stainless Steel

Impact of interfaces on bipolar resistive switching behavior in amorphous Ge-Sb-Te thin films

Collaborators (3)

Donat J. As

Andre Anders

Martin Rudolph

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