Matteo Meneghini

University of Padova

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Articles (21)

Collaborators (8)

Zhan Gao

Łukasiewicz Research Network - Institute of Microelectronics and Photonics

Willem van Driel

Delft University of Technology

Kornelius Tetzner

Ferdinand-Braun-Institut Leibniz-Institut für Höchstfrequenztechnik

Khanh Quoc Tran

Professor/Prof. Dr.-Ing.habil.

Technische Universität Darmstadt

Francesco Piva

University of Padua

Gaudenzio Meneghesso

Full Professor

University of Padua

Nicola Trivellin

University of Padova

Ulrich Schwarz

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Matteo Meneghini

Research Interests

Explore related searches

Contact this professor

Articles (21)

Collaborators (8)

Zhan Gao

Willem van Driel

Kornelius Tetzner

Khanh Quoc Tran

Francesco Piva

Gaudenzio Meneghesso

Nicola Trivellin

Ulrich Schwarz

Make your next move.

Matteo Meneghini

Research Interests

Explore related searches

Contact this professor

Articles (21)

Solid State Lighting Systems for Horticulture: Impact of LED Degradation on Light Spectrum and Intensity

Current Collapse in Buffer-Free GaN-on-SiC Power Transistors: Maxwell-Wagner Effect and Related Model

Hail Damage Investigation in Heterojunction Silicon Photovoltaic Modules: A Real-World Case Study

Changes in the extraction and collection efficiency of GaN-based MQW solar cells under optical step-stress

Evidence for double degradation regime in off-state stressed 100 V GaN transistors: From dielectric failure to subthreshold current increase

Impact of drain-source leakage on the dynamic Ron of power HEMTs with p-GaN gate

Interface-related VTH shift of SiC MOSFETs during constant current stress extracted from charge pumping measurements

Investigating the optical degradation of InAs quantum dot lasers on silicon through combined electro-optical characterization and gain measurements

Long-Term Analysis of Temperature and Current-Dependent Degradation in Green High-Power Light-Emitting Diodes

Long-term (8000 h) reliability and failures of high-power LEDs for outdoor lighting stressed at high ambient temperatures

V-Pits and Trench-Like Defects in High Periodicity MQWs GaN-Based Solar Cells: Extensive Electro-Optical Analysis

Gate leakage modeling in lateral β -Ga2O3 MOSFETs with Al2O3 gate dielectric

Performance and Degradation of Commercial Ultraviolet‐C Light‐Emitting Diodes for Disinfection Purposes

Analysis of Current Transport Layer Localized Resistivity Increase After High Stress on InGaN LEDs

On the CET-Map Ill-Posed Inversion Problem: Theory and Application to GaN HEMTs

Status of Performance and Reliability of 265 nm Commercial UV-C LEDs in 2023

Transconductance Overshoot, a New Trap-Related Effect in AlGaN/GaN HEMTs

Lifetime Prediction of Current-and Temperature-Induced Degradation in Silicone-Encapsulated 365 nm High-Power Light-Emitting Diodes

Nitride Semiconductors

Nitride Semiconductors

Cumulative Hot-Electron Trapping in GaN-Based Power HEMTs Observed by an Ultrafast (10 V/Ns) On-Wafer Methodology

Collaborators (8)

Zhan Gao

Willem van Driel

Kornelius Tetzner

Khanh Quoc Tran

Francesco Piva

Gaudenzio Meneghesso

Nicola Trivellin

Ulrich Schwarz

Make your next move.